Journal of Systems Engineering and Electronics ›› 2011, Vol. 33 ›› Issue (1): 222-0227.doi: 10.3969/j.issn.1001 506X.2011.01.45
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ZHANG Meng,SHI Yi-min,YANG Yang
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Abstract:
The reliability estimation of components with BurrXⅡ distribution in the threeseries system is investigated using masked system life data. Under general masked case, the approximate maximum likelihood estimation (MLE) of parameters is obtained by using iteration method and system simplify method to solve maximum likelihood equations, while the exact MLE is given under complete masked case. Meanwhile, the Bayes estimations of both parameters and reliabilities are obtained using squared error, LINEX and general entropy loss functions. Finally, numerical simulation results show that MLE and Bayes estimations both have a good performance, and a comparison is made between the two estimations.
ZHANG Meng,SHI Yi-min,YANG Yang. Reliability estimation for BurrXⅡ components in three-series system using masked data[J]. Journal of Systems Engineering and Electronics, 2011, 33(1): 222-0227.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001 506X.2011.01.45
https://www.sys-ele.com/EN/Y2011/V33/I1/222